Thermal Property Measurement System : AC Method Thermal Diffusivity Measurement System LaserPIT series
Thermal conductivity evaluation in-plane direction of films, thin sheets and thin films etc.
This system can measure thermal diffusivity of sheet materials in-plane direction by scanning laser heating AC method (Angstrom method).
About high thermal conducting films, sub-micron thin films can also be measurable.
Applications
• Evaluation of thin sheet materials with high thermal conductivity like diamond, aluminium nitride and SiC etc.
• Evaluation of thermal conductivity of various metallic thin films
• Evaluation of thermal conductivity of organic films in-plane direction like heat radiating sheets
Features
• Capable of measuring thermal diffusivity of various thin sheet materials in the range from room temperature to 200°C.
• Capable of measuring thermal conductivity of a 100nm or thicker thin film deposited on a substrate by a newly developed differential method
Specifications
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Model |
LaserPIT-R |
LaserPIT-M2 |
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Temperature range |
RT |
RT ～ 200 °C |
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AC power |
Diod laser (685nm, 30mW) |
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Sample size |
Self-standing thin sheet: W 2.5 ～ 5 mm × L 30 mm × 3 ～ 500 μm Thin film on a substrate: W 2.5 ～ 5 mm × L 30 mm × 100 ～ 1000 nm |
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Measurement period |
0.05 ～ 10/s |
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Atmosphere |
Vacuum |
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